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Electric‐Field‐Controlled Phase Transformation in WO 3 Thin Films through Hydrogen Evolution
Author(s) -
Wang Meng,
Shen Shengchun,
Ni Jinyang,
Lu Nianpeng,
Li Zhuolu,
Li HaoBo,
Yang Shuzhen,
Chen Tianzhe,
Guo Jingwen,
Wang Yujia,
Xiang Hongjun,
Yu Pu
Publication year - 2017
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201703628
Subject(s) - materials science , intercalation (chemistry) , thin film , electric field , ionic bonding , electrochemistry , chemical physics , nanotechnology , ion , optoelectronics , analytical chemistry (journal) , electrode , inorganic chemistry , chemistry , physics , quantum mechanics , chromatography
Field‐effect transistors with ionic‐liquid gating (ILG) have been widely employed and have led to numerous intriguing phenomena in the last decade, due to the associated excellent carrier‐density tunability. However, the role of the electrochemical effect during ILG has become a heavily debated topic recently. Herein, using ILG, a field‐induced insulator‐to‐metal transition is achieved in WO 3 thin films with the emergence of structural transformations of the whole films. The subsequent secondary‐ion mass spectrometry study provides solid evidence that electrochemically driven hydrogen evolution dominates the discovered electrical and structural transformation through surface absorption and bulk intercalation.