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Direct Imaging of Superwetting Behavior on Solid–Liquid–Vapor Triphase Interfaces
Author(s) -
Peng Yun,
Jin Xu,
Zheng Yongmei,
Han Dong,
Liu Kesong,
Jiang Lei
Publication year - 2017
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201703009
Subject(s) - microscale chemistry , wetting , materials science , nanotechnology , interface (matter) , nanoscopic scale , solid surface , contact angle , chemical physics , chemistry , mathematics education , mathematics , sessile drop technique , composite material
A solid–liquid–vapor interface dominated by a three‐phase contact line usually serves as an active area for interfacial reactions and provides a vital clue to surface behavior. Recently, direct imaging of the triphase interface of superwetting interfaces on the microscale/nanoscale has attracted broad scientific attention for both theoretical research and practical applications, and has gradually become an efficient and intuitive approach to explore the wetting behaviors of various multiphase interfaces. Here, recent progress on characterizing the solid–liquid–vapor triphase interface on the microscale/nanoscale with diverse types of imaging apparatus is summarized. Moreover, the accurate, visible, and quantitative information that can be obtained shows the real interfacial morphology of the wetting behaviors of multiphase interfaces. On the basis of fundamental research, technical innovations in imaging and complicated multiphase interfaces of the superwetting surface are also briefly presented.