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Homogeneous 2D MoTe 2 p–n Junctions and CMOS Inverters formed by Atomic‐Layer‐Deposition‐Induced Doping
Author(s) -
Lim June Yeong,
Pezeshki Atiye,
Oh Sehoon,
Kim Jin Sung,
Lee Young Tack,
Yu Sanghyuck,
Hwang Do Kyung,
Lee GwanHyoung,
Choi Hyoung Joon,
Im Seongil
Publication year - 2017
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201701798
Subject(s) - materials science , doping , nanosheet , optoelectronics , dangling bond , cmos , semiconductor , nanotechnology , atomic layer deposition , diode , depletion region , layer (electronics) , silicon
Recently, α‐MoTe 2 , a 2D transition‐metal dichalcogenide (TMD), has shown outstanding properties, aiming at future electronic devices. Such TMD structures without surface dangling bonds make the 2D α‐MoTe 2 a more favorable candidate than conventional 3D Si on the scale of a few nanometers. The bandgap of thin α‐MoTe 2 appears close to that of Si and is quite smaller than those of other typical TMD semiconductors. Even though there have been a few attempts to control the charge‐carrier polarity of MoTe 2 , functional devices such as p–n junction or complementary metal–oxide–semiconductor (CMOS) inverters have not been reported. Here, we demonstrate a 2D CMOS inverter and p–n junction diode in a single α‐MoTe 2 nanosheet by a straightforward selective doping technique. In a single α‐MoTe 2 flake, an initially p‐doped channel is selectively converted to an n‐doped region with high electron mobility of 18 cm 2 V −1 s −1 by atomic‐layer‐deposition‐induced H‐doping. The ultrathin CMOS inverter exhibits a high DC voltage gain of 29, an AC gain of 18 at 1 kHz, and a low static power consumption of a few nanowatts. The results show a great potential of α‐MoTe 2 for future electronic devices based on 2D semiconducting materials.