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Ultrasensitive SERS Detection by Defect Engineering on Single Cu 2 O Superstructure Particle
Author(s) -
Lin Jie,
Shang Yang,
Li Xiaoxia,
Yu Jian,
Wang Xiaotian,
Guo Lin
Publication year - 2017
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201604797
Subject(s) - superstructure , materials science , recrystallization (geology) , raman spectroscopy , particle (ecology) , copper , adsorption , metal , analytical chemistry (journal) , chemical physics , nanotechnology , chemistry , metallurgy , optics , thermodynamics , biology , paleontology , oceanography , physics , geology , chromatography
A Cu 2 O superstructure is constructed through a recrystallization‐induced self‐assembly strategy . Single Cu 2 O superstructure particle exhibits an outstanding surface‐enhanced Raman spectroscopy performance with the limit of detection as low as 10 −9 mol L −1 and metal comparable enhancement factor (8 × 10 5 ) due to the synergetic effect of vacancies defect‐facilitated charge‐transfer process and copper vacancies defect‐induced electrostatic adsorption.