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Temperature and Thickness Dependences of the Anisotropic In‐Plane Thermal Conductivity of Black Phosphorus
Author(s) -
Smith Brandon,
Vermeersch Bjorn,
Carrete Jesús,
Ou Eric,
Kim Jaehyun,
Mingo Natalio,
Akinwande Deji,
Shi Li
Publication year - 2017
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201603756
Subject(s) - phosphorene , materials science , black phosphorus , basal plane , anisotropy , thermal conductivity , condensed matter physics , graphene , graphite , reflection (computer programming) , crystal (programming language) , thermal , symmetry (geometry) , plane (geometry) , composite material , optics , thermodynamics , nanotechnology , optoelectronics , geometry , physics , computer science , programming language , mathematics
The anisotropic basal‐plane thermal conductivities of thin black phosphorus obtained from a new four‐probe measurement exhibit much higher peak values at low temperatures than previous reports. First principles calculations reveal the important role of crystal defects and weak thickness dependence that is opposite to the case of graphene and graphite due to the absence of reflection symmetry in puckered phosphorene.