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Near‐Field Imaging: Revealing Optical Properties of Reduced‐Dimensionality Materials at Relevant Length Scales (Adv. Mater. 38/2015)
Author(s) -
Ogletree D. Frank,
Schuck P. James,
WeberBargioni Alexander F.,
Borys Nicholas J.,
Aloni Shaul,
Bao Wei,
Barja Sara,
Lee Jiye,
Melli Mauro,
Munechika Keiko,
Whitelam Stephan,
Wickenburg Sebastian
Publication year - 2015
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201570255
Subject(s) - materials science , nanotechnology , nanomaterials , curse of dimensionality , characterization (materials science) , graphene , diffraction , field (mathematics) , length scale , optics , computer science , physics , artificial intelligence , mathematics , quantum mechanics , pure mathematics
Optimizing the optical properties of reduced‐dimensionality materials requires characterization at the relevant length scale, often below the diffraction limit. On page 5693, D. F. Ogletree and co‐workers review the current state of the art for 0D, 1D, and 2D nanomaterials, including novel techniques like the Molecular Foundry's Campanile probe.