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Transient Electronics: Thermally Triggered Degradation of Transient Electronic Devices (Adv. Mater. 25/2015)
Author(s) -
Park Chan Woo,
Kang SeungKyun,
Hernandez Hector Lopez,
Kaitz Joshua A.,
Wie Dae Seung,
Shin Jiho,
Lee Olivia P.,
Sottos Nancy R.,
Moore Jeffrey S.,
Rogers John A.,
White Scott R.
Publication year - 2015
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201570168
Subject(s) - materials science , transient (computer programming) , degradation (telecommunications) , wax , electronics , optoelectronics , flexible electronics , paraffin wax , composite material , electrical engineering , computer science , engineering , operating system
Thermally triggered degradation of transient electronics is accomplished by S.R. White and co‐workers using protective wax coatings that melt and release encapsulated acid microdroplets, as described on page 3783. A self‐destructive device is shown, where heat triggering is remotely controlled. The heater of the device is wirelessly powered through inductive coupling, and subsequent melting of the wax then leads to rapid device destruction via acidic degradation of the electronic components.