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Nanogap Electrodes: Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1–2 nm by Focused Ion Beam Milling (Adv. Mater. 19/2015)
Author(s) -
Cui Ajuan,
Liu Zhe,
Dong Huanli,
Wang Yujin,
Zhen Yonggang,
Li Wuxia,
Li Junjie,
Gu Changzhi,
Hu Wenping
Publication year - 2015
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201570131
Subject(s) - materials science , fabrication , electrode , electronic circuit , nanotechnology , focused ion beam , grain boundary , optoelectronics , ion , composite material , electrical engineering , medicine , chemistry , alternative medicine , physics , microstructure , pathology , quantum mechanics , engineering
Molecular devices are among the most promising candidates for the ultimate minimization of electronic devices and the construction of super‐integrated circuits, the foundation of which is the fabrication of nanogap electrodes through which molecules can be connected into devices and circuits. A new method for facile fabrication nanogap electrodes is a pre‐requirement for molecular devices. A method for the fabrication of nanogap electrodes through the breakage of a single grain‐boundary (GB) junction is presented by W. Hu and co‐workers on page 3002.