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In Operando X‐Ray Nanodiffraction Reveals Electrically Induced Bending and Lattice Contraction in a Single Nanowire Device
Author(s) -
Wallentin Jesper,
Osterhoff Markus,
Salditt Tim
Publication year - 2016
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201504188
Subject(s) - materials science , nanowire , diffraction , conductance , biasing , x ray , lattice (music) , bending , condensed matter physics , voltage , nanotechnology , optics , composite material , electrical engineering , physics , acoustics , engineering
Hard X‐ray diffraction (XRD) using a nanofocused beam is used to measure both lattice contraction and bending in a single nanowire device under electric bias. The shape of the nanowire is reconstructed in 3D with sub‐nanometer precision. As the bias voltage is gradually increased, nonreversible structural changes in the contact regions are observed, correlated with degradation of the electrical conductance.