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Kinetic Nature of Grain Boundary Formation in As‐Grown MoS 2 Monolayers
Author(s) -
Cheng Jingxin,
Jiang Tao,
Ji Qingqing,
Zhang Yu,
Li Zhiming,
Shan Yuwei,
Zhang Yanfeng,
Gong Xingao,
Liu Weitao,
Wu Shiwei
Publication year - 2015
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201501354
Subject(s) - grain boundary , materials science , crystallite , monolayer , anisotropy , kinetics , condensed matter physics , grain growth , enhanced data rates for gsm evolution , polarization (electrochemistry) , grain boundary strengthening , kinetic energy , chemical physics , crystallography , grain size , composite material , optics , nanotechnology , metallurgy , chemistry , microstructure , physics , telecommunications , quantum mechanics , computer science
Grain boundaries in as‐grown polycrystalline MoS 2 monolayers are revealed by second‐harmonic‐generation microscopy. Through the anisotropic polarization pattern and phase interference at the grain boundary, grain edge termination and boundary types are identified. Statistical analysis on hundreds of grains shows that grain‐boundary formation is driven by kinetics and can be nicely described by the edge attachment growth model.