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Observing Atoms at Work by Controlling Beam–Sample Interactions
Author(s) -
Kisielowski Christian
Publication year - 2015
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201500082
Subject(s) - materials science , atom (system on chip) , resolution (logic) , transmission electron microscopy , cathode ray , sample (material) , beam (structure) , sensitivity (control systems) , electron microscope , electron , work (physics) , optics , scanning transmission electron microscopy , nanotechnology , computer science , physics , artificial intelligence , electronic engineering , nuclear physics , engineering , thermodynamics , embedded system
Functional behavior can be initiated and captured in series of images with previously unknown details using a successful effort to effectively control beam–sample interactions in high‐resolution transmission electron microscopy. The approach uses tunable electron dose rates that can be chosen to be as low as attoamperes per square‐Ångstrom to delay sample degradation to an unexplored end. Dose rates can be systematically increased to stimulate and observe dynamic object responses. Observations can be made in real time with deep sub‐Ångstrom resolution and single‐atom sensitivity, even if radiation‐sensitive matter is probed and either pressure or temperature is raised in the electron microscope.