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X‐ray Imaging for Non‐Destructive Microstructure Analysis at SSRF
Author(s) -
Chen Rongchang,
Liu Ping,
Xiao Tiqiao,
Xu Lisa X.
Publication year - 2014
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201402956
Subject(s) - beamline , synchrotron radiation , materials science , synchrotron , medical physics , planar , optics , x ray , medical imaging , modalities , computer science , radiology , physics , computer graphics (images) , medicine , beam (structure) , social science , sociology
The X‐ray imaging beamline at the Shanghai Synchrotron Radiation Facility is aimed at developing and evaluating the effectiveness of synchrotron radiation (SR)‐based imaging techniques in planar or computed tomography modalities. Several X‐ray imaging methods are in use and find extensive applications in many research fields. In this Essay, the status of the methodology development at the beamline is discussed and applications are reviewed.