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Nanometer Scale Alignment of Block‐Copolymer Domains by Means of a Scanning Probe Tip
Author(s) -
Felts Jonathan R.,
Onses M. Serdar,
Rogers John A.,
King William P.
Publication year - 2014
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201305481
Subject(s) - copolymer , materials science , lamellar structure , shearing (physics) , nanometre , nanoscopic scale , nanostructure , perpendicular , atomic force microscopy , nanotechnology , scanning probe microscopy , block (permutation group theory) , domain (mathematical analysis) , polymer , composite material , geometry , mathematics , mathematical analysis
Alignment of perpendicularly oriented lamellar block copolymer domains using an AFM tip is demonstrated. The AFM tip orients the domains through local shearing, resulting in domain alignment parallel to tip travel. AFM tips can also deposit block copolymer nanostructures on heated substrates with a variety of experimentally observed domain alignments.