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Valence to Core X‐ray Emission Spectroscopy
Author(s) -
Gallo Erik,
Glatzel Pieter
Publication year - 2014
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201304994
Subject(s) - valence (chemistry) , emission spectrum , materials science , spectroscopy , core electron , electronic structure , valence electron , photoemission spectroscopy , x ray photoelectron spectroscopy , characterization (materials science) , atomic physics , electron , spectral line , nanotechnology , physics , condensed matter physics , nuclear magnetic resonance , quantum mechanics , astronomy
This Progress Report discusses the chemical sensitivity of Kβ valence to core X‐ray emission spectroscopy (vtc‐XES) and its applications for investigating 3 d ‐transition‐metal based materials. Vtc‐XES can be used for ligand identification and for the characterization of the valence electronic levels. The technique provides information that is similar to valence band photoemission spectroscopy but the sample environment can be chosen freely and thus allows measurements in presence of gases and liquids and it can be applied for measurements under in situ/operando or extreme conditions. The theoretical basis of the technique is presented using a one‐electron approach and the vtc‐XES spectral features are interpreted using ground state density functional theory calculations. Some recent results obtained by vtc‐XES in various scientific fields are discussed to demonstrate the potential and future applications of this technique. Resonant X‐ray emission spectroscopy is briefly introduced with some applications for the study of 3 d and 5 d ‐transition‐metal based systems.