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A Direct Evidence of Morphological Degradation on a Nanometer Scale in Polymer Solar Cells
Author(s) -
Schaffer Christoph J.,
Palumbiny Claudia M.,
Niedermeier Martin A.,
Jendrzejewski Christian,
Santoro Gonzalo,
Roth Stephan V.,
MüllerBuschbaum Peter
Publication year - 2013
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201302854
Subject(s) - grazing incidence small angle scattering , materials science , nanometre , scattering , degradation (telecommunications) , polymer , scale (ratio) , tracking (education) , detector , optoelectronics , nanotechnology , optics , engineering physics , computer science , physics , composite material , telecommunications , psychology , pedagogy , neutron scattering , quantum mechanics , small angle neutron scattering
In situ measurement of a polymer solar cell using micro grazing incidence small angle X‐ray scattering (μGISAXS) and current–voltage tracking is demonstrated. While measuring electric characteristics under illumination, morphological changes are probed by μGISAXS. The X‐ray beam (green) impinges on the photo active layer with a shallow angle and scatters on a 2d detector. Degradation is explained by the ongoing nanomorphological changes observed.