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Vibration‐Assisted Crystallization Improves Organic/Dielectric Interface in Organic Thin‐Film Transistors
Author(s) -
Diemer Peter J.,
Lyle Christopher R.,
Mei Yaochuan,
Sutton Christopher,
Payne Marcia M.,
Anthony John E.,
Coropceanu Veaceslav,
Brédas JeanLuc,
Jurchescu Oana D.
Publication year - 2013
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201302838
Subject(s) - materials science , fabrication , crystallization , organic semiconductor , thin film transistor , dielectric , optoelectronics , vibration , interface (matter) , semiconductor , throughput , transistor , nanotechnology , chemical engineering , composite material , acoustics , electrical engineering , computer science , alternative medicine , capillary number , voltage , capillary action , pathology , engineering , layer (electronics) , medicine , physics , telecommunications , wireless
Solution processability of organic semiconductors allows high‐throughput fabrication on arbitrary substrates at low‐cost, but the films often exhibit low performance. Here, we report on a new method for device fabrication, vibration assisted crystallization (VAC) that produces superior films, which approach the fundamental performance limits shown in corresponding single‐crystal measurements.