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Organic Semiconductors: Wide‐Range Refractive Index Control of Organic Semiconductor Films Toward Advanced Optical Design of Organic Optoelectronic Devices (Adv. Mater. 47/2012)
Author(s) -
Yokoyama Daisuke,
Nakayama Kenichi,
Otani Toshiya,
Kido Junji
Publication year - 2012
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201290302
Subject(s) - organic semiconductor , materials science , refractive index , semiconductor , optoelectronics , optics , physics
Over the past quarter century of organic semiconductor research, refractive index control of organic semiconductor thin films has never been discussed. Daisuke Yokoyama and co‐workers demonstrate on page 6368 a large refractive index difference of 0.58 in organic semiconductor films and fabricated organic photoconductive DBRs (distributed Bragg reflectors) with a reflectivity of >98%. These findings provide us with new additional freedom and strategies in advanced optical design of organic semiconductor devices.

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