Structural and Electronic Reconstructions at the LaAlO 3 /SrTiO 3  Interface | Zendy

Salluzzo M. | Zendy; Gariglio S. | Zendy; Torrelles X. | Zendy; Ristic Z. | Zendy; Di Capua R. | Zendy; Drnec J. | Zendy; Sala M. Moretti | Zendy; Ghiringhelli G. | Zendy; Felici R. | Zendy; Brookes N. B. | Zendy

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Structural and Electronic Reconstructions at the LaAlO 3 /SrTiO 3 Interface

Author(s) -

Salluzzo M.,

Gariglio S.,

Torrelles X.,

Ristic Z.,

Di Capua R.,

Drnec J.,

Sala M. Moretti,

Ghiringhelli G.,

Felici R.,

Brookes N. B.

Publication year - 2013

Publication title -

advanced materials

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 10.707

H-Index - 527

eISSN - 1521-4095

pISSN - 0935-9648

DOI - 10.1002/adma.201204555

Subject(s) - materials science , interface (matter) , realization (probability) , synchrotron , condensed matter physics , electronic structure , thin film , crystallography , nanotechnology , chemical physics , engineering physics , optics , physics , composite material , statistics , mathematics , chemistry , capillary number , capillary action

A full understanding of the mechanism of the formation of a two‐dimensional electron gas (2DEG) at the interface between insulating LaAlO 3 (LAO) thin films and bulk SrTiO 3 (STO) crystals is a prerequisite for the full exploitation of this class of materials. Here, by using a combination of advanced X‐ray synchrotron‐based spectroscopic and structural measurements, it is shown that a structural and electronic reconstruction of the interface occurs before the realization of the 2DEG.

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