Premium
Structural and Electronic Reconstructions at the LaAlO 3 /SrTiO 3 Interface
Author(s) -
Salluzzo M.,
Gariglio S.,
Torrelles X.,
Ristic Z.,
Di Capua R.,
Drnec J.,
Sala M. Moretti,
Ghiringhelli G.,
Felici R.,
Brookes N. B.
Publication year - 2013
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201204555
Subject(s) - materials science , interface (matter) , realization (probability) , synchrotron , condensed matter physics , electronic structure , thin film , crystallography , nanotechnology , chemical physics , engineering physics , optics , physics , composite material , statistics , mathematics , chemistry , capillary number , capillary action
A full understanding of the mechanism of the formation of a two‐dimensional electron gas (2DEG) at the interface between insulating LaAlO 3 (LAO) thin films and bulk SrTiO 3 (STO) crystals is a prerequisite for the full exploitation of this class of materials. Here, by using a combination of advanced X‐ray synchrotron‐based spectroscopic and structural measurements, it is shown that a structural and electronic reconstruction of the interface occurs before the realization of the 2DEG.