Premium
Space‐Resolved In‐Plane Moduli of Graphene Oxide and Chemically Derived Graphene Applying a Simple Wrinkling Procedure
Author(s) -
Kunz Daniel A.,
Feicht Patrick,
Gödrich Sebastian,
Thurn Herbert,
Papastavrou Georg,
Fery Andreas,
Breu Josef
Publication year - 2013
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201204049
Subject(s) - graphene , materials science , oxide , simple (philosophy) , nanotechnology , space (punctuation) , micrometer , substrate (aquarium) , graphene oxide paper , resolution (logic) , composite material , computer science , optics , physics , artificial intelligence , philosophy , oceanography , epistemology , geology , metallurgy , operating system
Mapping the in‐plane moduli: A simple wrinkling process on a deformable substrate requiring only readily available topographical atomic force microscopy (AFM) imaging allows space‐resolved determination of the mechanical properties of single graphene oxide and chemically derived graphene sheets. The lateral resolution in the sub‐micrometer range delivers unique insights into the defect distribution within the nanoplatelets.