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Advanced Electron Microscopy for Advanced Materials
Author(s) -
Van Tendeloo Gustaaf,
Bals Sara,
Van Aert Sandra,
Verbeeck Jo,
Van Dyck Dirk
Publication year - 2012
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201202107
Subject(s) - valency , materials science , nanotechnology , electron microscope , atomic units , microscopy , electron , field (mathematics) , engineering physics , optics , physics , quantum mechanics , philosophy , linguistics , mathematics , pure mathematics
The idea of this Review is to introduce newly developed possibilities of advanced electron microscopy to the materials science community. Over the last decade, electron microscopy has evolved into a full analytical tool, able to provide atomic scale information on the position, nature, and even the valency atoms. This information is classically obtained in two dimensions (2D), but can now also be obtained in 3D. We show examples of applications in the field of nanoparticles and interfaces.