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Multilayer Graphene‐Coated Atomic Force Microscopy Tips for Molecular Junctions
Author(s) -
Wen Yugeng,
Chen Jianyi,
Guo Yunlong,
Wu Bin,
Yu Gui,
Liu Yunqi
Publication year - 2012
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201200579
Subject(s) - graphene , materials science , nanotechnology , atomic force microscopy , yield (engineering) , graphene nanoribbons , microscopy , conductive atomic force microscopy , kelvin probe force microscope , optoelectronics , composite material , optics , physics
Multilayer graphene tips are developed for conducting probe atomic force microscopy for the formation of molecular junctions. Molecular junctions using graphene tips show very small tip‐to‐tip variance, excellent operational stability, good endurance, and long shelf‐life. These properties, together with high yield and the simple processing involved, suggest that commercial mass‐production of graphene tips is viable for molecular electronic applications.

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