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Autonomic Restoration of Electrical Conductivity
Author(s) -
Blaiszik Benjamin J.,
Kramer Sharlotte L. B.,
Grady Martha E.,
McIlroy David A.,
Moore Jeffrey S.,
Sottos Nancy R.,
White Scott R.
Publication year - 2012
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201102888
Subject(s) - materials science , millisecond , electrical conductor , electrical resistivity and conductivity , metal , indium , conductivity , conductance , liquid metal , gallium , optoelectronics , composite material , nanotechnology , metallurgy , electrical engineering , chemistry , physics , mathematics , combinatorics , astronomy , engineering
Self‐healing of an electrical circuit is demonstrated with nearly full recovery of conductance less than one millisecond after damage. Crack damage breaks a conductive pathway in a multilayer device, interrupting electron transport and simultaneously rupturing adjacent microcapsules containing gallium–indium liquid metal (top). The released liquid metal flows to the area of damage, restoring the conductive pathway (bottom).