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Dimensional Reduction: A Design Tool for New Radiation Detection Materials
Author(s) -
Androulakis John,
Peter Sebastian C.,
Li Hao,
Malliakas Christos D.,
Peters John A.,
Liu Zhifu,
Wessels Bruce W.,
Song JungHwan,
Jin Hosub,
Freeman Arthur J.,
Kanatzidis Mercouri G.
Publication year - 2011
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201102450
Subject(s) - reduction (mathematics) , field (mathematics) , detector , materials science , computer science , nanotechnology , semiconductor , information retrieval , data science , optoelectronics , telecommunications , geometry , mathematics , pure mathematics
Semiconductor materials for efficient hard radiation detection are identified by combining a powerful chemical concept called dimensional reduction and precise theoretical electronic structure calculations. After more than 50 years of research and development in the field, this constitutes a significant step forward in the search for new detector materials.
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