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Sub‐Micrometer Charge Modulation Microscopy of a High Mobility Polymeric n‐Channel Field‐Effect Transistor
Author(s) -
Sciascia Calogero,
Martino Nicola,
Schuettfort Torben,
Watts Benjamin,
Grancini Giulia,
Antognazza Maria Rosa,
ZavelaniRossi Margherita,
McNeill Christopher R.,
Caironi Mario
Publication year - 2011
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201102410
Subject(s) - materials science , micrometer , field effect transistor , transistor , modulation (music) , microscopy , optoelectronics , optical microscope , nanotechnology , optics , scanning electron microscope , electrical engineering , voltage , composite material , philosophy , physics , engineering , aesthetics
Electro‐optical mapping of the charge density with sub‐micrometer resolution can be obtained in a high mobility, top‐gate n‐channel polymer field‐effect transistor by charge modulation microscopy. Local features on the 1 μm scale are unveiled and, using scanning transmission X‐ray microscopy measurements, are attributed to structural variations within the polymeric film.