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Resistive Switching Phenomena in Li x CoO 2 Thin Films
Author(s) -
Moradpour Alec,
Schneegans Olivier,
Franger Sylvain,
Revcolevschi Alexandre,
Salot Raphaël,
AubanSenzier Pascale,
Pasquier Claude,
Svoukis Efthymios,
Giapintzakis John,
Dragos Oana,
Ciomaga VasileCristian,
Chrétien Pascal
Publication year - 2011
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201101800
Subject(s) - materials science , thin film , resistive touchscreen , atomic force microscopy , conductive atomic force microscopy , oxide , analytical chemistry (journal) , optoelectronics , resistive random access memory , voltage , nanotechnology , electrical engineering , chemistry , chromatography , metallurgy , engineering
A substantial resistive switching of Li x CoO 2 mixed‐conductor thin films is observed for the first time. The occurrence of possible bipolar switching in these oxide thin films is by current–voltage curves, investigated by conducting‐probe atomic force microscopy (CP‐AFM). The films are incorporated into an {Au/Li x CoO 2 /p++Si} device and exhibit a significant resistive‐switching process involving a ratio of over four orders of magnitude.