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Nanoscale Structure and Mechanism for Enhanced Electromechanical Response of Highly Strained BiFeO 3 Thin Films
Author(s) -
Damodaran Anoop R.,
Liang ChenWei,
He Qing,
Peng ChunYen,
Chang Li,
Chu YingHao,
Martin Lane W.
Publication year - 2011
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201101164
Subject(s) - materials science , monoclinic crystal system , tetragonal crystal system , nanoscopic scale , thin film , diffraction , phase (matter) , nanotechnology , electric field , multiferroics , optoelectronics , crystal structure , ferroelectricity , crystallography , optics , dielectric , chemistry , physics , organic chemistry , quantum mechanics
The presence of a variety of structural variants in BiFeO 3 thin films give rise to exotic electric‐field‐induced responses and resulting electromechanical responses as large as 5%. Using high‐resolution X‐ray diffraction and scanning‐probe‐microscopy‐based studies the numerous phases present at the phase boundaries are identified and an intermediate monoclinic phase, in addition to the previously observed rhombohedral‐ and tetragonal‐like phases, is discovered.