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Resolving Bulk and Grain Boundary Transport Properties of TiO 2 Thin Films Enabled by Laser‐Induced Anisotropic Morphology
Author(s) -
Ankonina Guy,
Chung UiJin,
Chitu Adrian M.,
Komem Yigal,
Rothschild Avner
Publication year - 2011
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201100917
Subject(s) - materials science , grain boundary , morphology (biology) , anisotropy , ferroelectricity , thin film , piezoelectricity , spectroscopy , dielectric spectroscopy , grain size , laser , texture (cosmology) , nanotechnology , optoelectronics , composite material , optics , computer science , microstructure , image (mathematics) , physics , artificial intelligence , genetics , electrode , quantum mechanics , electrochemistry , dielectric , biology
Precise deconvolution of grain and grain boundary contributions to the overall impedance of TiO 2 thin films is achieved by impedance spectroscopy measurements of textured films with elongated grains obtained by laser‐induced melting and sequential lateral solidification. The ability to engineer the grain morphology of electroceramic films provides opportunities for new designs of ferroelectric memories, piezoelectric microsensors and microactuators, optical waveguides, and other devices.