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3D Atomic Force Microscopy: Three‐Dimensional Atomic Force Microscopy – Taking Surface Imaging to the Next Level (Adv. Mater. 26–27/2010)
Author(s) -
Baykara Mehmet Z.,
Schwendemann Todd C.,
Altman Eric I.,
Schwarz Udo D.
Publication year - 2010
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201090089
Subject(s) - materials science , atomic force microscopy , microscopy , kelvin probe force microscope , conductive atomic force microscopy , nanotechnology , atomic force acoustic microscopy , photoconductive atomic force microscopy , magnetic force microscope , scanning confocal electron microscopy , scanning capacitance microscopy , optics , composite material , scanning electron microscope , physics , magnetization , quantum mechanics , magnetic field
Recent progress in scanning probe technology, which has led to the establishment of threedimensional atomic force microscopy, is reported on p. 2838 by Mehmet Baykara and co‐workers. From the quantitative data on surface force and energy fields the method delivers, lateral force maps with picometer resolution can be generated. All cover and frontispiece artwork by Wendolyn Hill.