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Ultrahigh Strain Hardening in Thin Palladium Films with Nanoscale Twins
Author(s) -
Idrissi Hosni,
Wang Binjie,
Colla Marie Stéphane,
Raskin Jean Pierre,
Schryvers Dominique,
Pardoen Thomas
Publication year - 2011
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201004160
Subject(s) - materials science , nanocrystalline material , nanoscopic scale , thin film , transmission electron microscopy , work hardening , strain hardening exponent , hardening (computing) , palladium , ductility (earth science) , nanocrystal , composite material , nanotechnology , microstructure , chemistry , layer (electronics) , catalysis , biochemistry , creep
Nanocrystalline Pd thin films containing coherent growth twin boundaries are deformed using on‐chip nanomechanical testing. A large work‐hardening capacity is measured. The origin of the observed behavior is unraveled using transmission electron microscopy and shows specific dislocations and twin boundaries interactions. The results indicate the potential for large strength and ductility balance enhancement in Pd films, as needed in membranes for H technologies.