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Multi‐Energy X‐ray Imaging as a Quantitative Method for Materials Characterization
Author(s) -
Firsching M.,
Nachtrab F.,
Uhlmann N.,
Hanke R.
Publication year - 2011
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201004111
Subject(s) - characterization (materials science) , materials science , energy (signal processing) , decomposition , x ray , nanotechnology , optics , physics , ecology , quantum mechanics , biology
X‐ray imaging is an established tool for materials characterization even though it usually has the drawback of not being a quantitative method. This drawback can be overcome by energy‐sensitive X‐ray imaging methods such as the basis material decomposition method presented in this paper, which can provide quantitative results for materials characterization.