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Nanoscale Characterization of Tetrabenzoporphyrin and Fullerene‐Based Solar Cells by Photoconductive Atomic Force Microscopy
Author(s) -
Guide Michele,
Dang XuanDung,
Nguyen ThucQuyen
Publication year - 2011
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201003644
Subject(s) - materials science , photoconductivity , characterization (materials science) , nanoscopic scale , atomic force microscopy , fullerene , nanotechnology , organic solar cell , photoconductive atomic force microscopy , photovoltaic system , layer (electronics) , conductive atomic force microscopy , optoelectronics , kelvin probe force microscope , scanning electron microscope , polymer , composite material , scanning capacitance microscopy , chemistry , scanning confocal electron microscopy , ecology , biology , organic chemistry
The subtle role of molecular design in determining organic photovoltaic performance performance is demonstrated with the aid of photoconductive atomic force microscopy. Each layer of OPV devices with a p/i/n architecture containing BP and PCBM or PCBNB is characterized using conducting and photoconducting AFM to gain insight as to why these devices perform differently in the bulk. The results illustrate how a slight change in the chemical structure of the layers can have a large impact in the film morphology, phase separation, and the device performance.