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Thin Film Structure of Triisopropylsilylethynyl‐Functionalized Pentacene and Tetraceno[2,3‐b]thiophene from Grazing Incidence X‐Ray Diffraction
Author(s) -
Mannsfeld Stefan C. B.,
Tang Ming Lee,
Bao Zhenan
Publication year - 2011
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201003135
Subject(s) - pentacene , materials science , diffraction , thin film , thiophene , synchrotron , organic semiconductor , x ray crystallography , nanotechnology , optoelectronics , crystallography , optics , thin film transistor , chemistry , physics , organic chemistry , layer (electronics)
The specific molecular arrangement of triisopropylsilylethynyl (TIPS)‐functionalized acenes is widely considered to be the origin of the high performance of TIPS‐pentacene thin film devices. However, detailed information on the molecular packing is so far only available for bulk single crystals, and the molecular packing of TIPS‐functionalized acenes in thin films has not been directly determined to date. A combination of ultrabright synchrotron grazing incidence X‐ray diffraction (GIXD) and crystallographic refinement calculations is utilized to obtain precise information about the molecular packing of two high‐performance TIPS‐functionalized semiconductors, TIPS‐ tetraceno[2,3‐b]thiophene and TIPS‐pentacene, in thin films on silicon oxide.