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Surface Potential Mapping of SAM‐Functionalized Organic Semiconductors by Kelvin Probe Force Microscopy
Author(s) -
Ellison David J.,
Lee Bumsu,
Podzorov V.,
Frisbie C. Daniel
Publication year - 2011
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201003122
Subject(s) - rubrene , kelvin probe force microscope , doping , materials science , dipole , organic semiconductor , semiconductor , intramolecular force , surface (topology) , microscopy , nanotechnology , chemical physics , optoelectronics , atomic force microscopy , optics , chemistry , physics , stereochemistry , organic chemistry , geometry , mathematics
Kelvin probe force microscopy measurements on rubrene single crystals partially coated with fluorinated and non‐fluorinated SAM derivatives are employed to determine the SAM‐induced surface potentials caused by an interfacial charge‐transfer doping process resulting in an interface dipole. The surface potential and topographic information in turn allow calculation of the effective intramolecular electric fields and carrier densities due to doping in the SAM‐modified rubrene crystals.