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Molecular Characterization of Organic Electronic Films
Author(s) -
DeLongchamp Dean M.,
Kline R. Joseph,
Fischer Daniel A.,
Richter Lee J.,
Toney Michael F.
Publication year - 2011
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201001760
Subject(s) - materials science , amorphous solid , characterization (materials science) , organic electronics , electronics , polymer , nanotechnology , layer (electronics) , morphology (biology) , molecule , crystallography , organic chemistry , composite material , transistor , chemistry , physics , quantum mechanics , voltage , biology , genetics
Organic electronics have emerged as a viable competitor to amorphous silicon for the active layer in low‐cost electronics. The critical performance of organic electronic materials is closely related to their morphology and molecular packing. Unlike their inorganic counterparts, polymers combine complex repeat unit structure and crystalline disorder. This combination prevents any single technique from being able to uniquely solve the packing arrangement of the molecules. Here, a general methodology for combining multiple, complementary techniques that provide accurate unit cell dimensions and molecular orientation is described. The combination of measurements results in a nearly complete picture of the organic film morphology.