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Fabrication of Surface Plasmon‐Coupled Si Nanodots in Au‐Embedded Silicon Oxide Nanowires
Author(s) -
Park GyeongSu,
Kwon Hyuksang,
Lee Eun Kyung,
Kim Seong Keun,
Lee Jun Ho,
Li Xiang Shu,
Chung Jae Gwan,
Heo Sung,
Song In Yong,
Lee Jae Hak,
Choi Byoung Lyong,
Kim Jong Min
Publication year - 2010
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201000328
Subject(s) - materials science , nanodot , surface plasmon resonance , electron energy loss spectroscopy , silicon , plasmon , localized surface plasmon , nanowire , colloidal gold , nanoparticle , nanotechnology , transmission electron microscopy , scanning electron microscope , silicon oxide , surface plasmon , optoelectronics , silicon nitride , composite material
High‐density amorphous silicon nanodots are easily produced by irradiating gold‐nanoparticle‐embedded silicon oxide nanowires with a low‐intensity electron beam. The optical characteristics of Si nanodots in the vicinity of gold nanoparticles exhibit evidence of strong coupling to the surface plasmon resonance of the Au nanoparticles, as manifested by their markedly enhanced electron‐induced excitation in our monochromated scanning transmission electron microscopy–electron energy‐loss spectroscopy measurements.