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Ultrafast Imaging and the Phase Problem for Inelastic X‐Ray Scattering
Author(s) -
Abbamonte Peter,
Wong Gerard C. L.,
Cahill David G.,
Reed James P.,
Coridan Robert H.,
Schmidt Nathan W.,
Lai Ghee Hwee,
Joe Young Il,
Casa Diego
Publication year - 2010
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.200904098
Subject(s) - attosecond , scattering , physics , phase problem , ultrashort pulse , inelastic scattering , phase (matter) , neutron scattering , fourier transform , optics , computational physics , quantum mechanics , diffraction , laser
A new method for imaging ultrafast dynamics in condensed matter using inelastic X‐ray scattering (IXS) is described. Using the concepts of causality and irreversibility a general solution to the inverse scattering problem (or “phase problem”) for IXS is illustrated, which enables direct imaging of dynamics of the electron density with resolutions of ∼1 attosecond (10 −18 s) in time and <1 Å in space. This method is not just Fourier transformation of the IXS data, but a means to impose causality on the data and reconstruct the charge propagator. The method can also be applied to inelastic electron or neutron scattering. A general outline of phenomena that can and cannot be studied with this technique and an outlook for the future is provided.