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Thermally Induced Failure of Polymer Dielectrics
Author(s) -
Johnson Ross S.,
Cicotte Kirsten N.,
Mahoney Patrick J.,
Tuttle Bruce A.,
Dirk Shawn M.
Publication year - 2010
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.200903617
Subject(s) - materials science , polymer , capacitor , dielectric , poly(p phenylene) , phenylene , polymer chemistry , optoelectronics , composite material , voltage , electrical engineering , engineering
Halogen precursor polymers to poly[(2,3‐diphenyl‐ p ‐phenylene)vinylene] (DP‐PPV) are examined for use as advanced capacitor dielectrics. The polymer is demonstrated to function as a good dielectric until it reaches a set temperature determined by the stability of the leaving groups. Conjugation of the polymer backbone at high temperature effectively disables the capacitor, providing a ‘built‐in’ safety mechanism for electronic devices. Conducting Polymers.
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