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A Thermally Stable Semiconducting Polymer
Author(s) -
Cho Shinuk,
Seo Jung Hwa,
Park Sung Heum,
Beaupré Serge,
Leclerc Mario,
Heeger Alan J.
Publication year - 2010
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.200903420
Subject(s) - materials science , annealing (glass) , polymer , x ray photoelectron spectroscopy , thermal stability , absorption spectroscopy , transistor , absorption (acoustics) , optoelectronics , chemical engineering , analytical chemistry (journal) , organic chemistry , optics , electrical engineering , composite material , chemistry , physics , engineering , voltage
The thermal stability of the poly(2,7‐carbazole) derivative (PCDTBT) is investigated. UV–visible absorption spectra and X‐ray photoelectron spectroscopy data demonstrate that the electronic structure of PCDTBT is stable in air at annealing temperatures up to 150 °C and in N 2 even after exposure to temperatures up to 350 °C. Field‐effect transistors fabricated with PCDTBT show stable characteristics and hole mobility up to 150 °C (air) and 350 °C (N 2 ).