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“Charge Leakage” at LaMnO 3 /SrTiO 3 Interfaces
Author(s) -
GarciaBarriocanal Javier,
Bruno Flavio Y.,
RiveraCalzada Alberto,
Sefrioui Zouhair,
Nemes Norbert M.,
GarciaHernández Mar,
RubioZuazo Juan,
Castro German R.,
Varela Maria,
Pennycook Stephen J.,
Leon Carlos,
Santamaria Jacobo
Publication year - 2010
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.200902263
Subject(s) - materials science , manganite , superlattice , leakage (economics) , epitaxy , charge ordering , oxide , charge (physics) , optoelectronics , condensed matter physics , nanotechnology , ferromagnetism , layer (electronics) , physics , quantum mechanics , metallurgy , economics , macroeconomics
Direct evidence for charge leakage at the interface of epitaxial SrTiO 3 /LaMnO 3 superlattices with atomically sharp interfaces is provided. The direction of charge leakage can be reversed by changing the LMO/STO thickness ratio. This result will be important for the understanding of some of the reported limitations of oxide devices involving manganite/titanate interfaces.