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Vertical Interface Effect on the Physical Properties of Self‐Assembled Nanocomposite Epitaxial Films
Author(s) -
Yang Hao,
Wang Haiyan,
Yoon Jongsik,
Wang Yongqiang,
Jain Menka,
Feldmann David M.,
Dowden Paul C.,
MacManusDriscoll Judith L.,
Jia Quanxi
Publication year - 2009
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.200900781
Subject(s) - materials science , nanocomposite , epitaxy , dielectric , nanoscopic scale , oxide , nanotechnology , composite material , lattice (music) , interface (matter) , metal , optoelectronics , layer (electronics) , metallurgy , physics , capillary number , capillary action , acoustics
Vertical interface effect on the physical properties of epitaxial metal‐oxide films is demonstrated. Self‐assembled (BiFeO 3 ) 0.5 :(Sm 2 O 3 ) 0.5 nanocomposite films are fabricated with three‐dimensional heteroepitaxy having an ordered nano‐columnar structure on a large scale. The vertical interface effect on lattice parameters, dielectric properties, and leakage currents is investigated.