Premium
Polaron Localization at Interfaces in High‐Mobility Microcrystalline Conjugated Polymers
Author(s) -
Zhao N.,
Noh Y.Y.,
Chang J.F.,
Heeney M.,
McCulloch I.,
Sirringhaus H.
Publication year - 2009
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.200900326
Subject(s) - polaron , materials science , dielectric , conjugated system , polymer , microcrystalline , crystallinity , chemical physics , condensed matter physics , high κ dielectric , optoelectronics , crystallography , composite material , physics , electron , chemistry , quantum mechanics
The charge‐induced optical absorptions of two‐dimensional polarons in semicrystalline, high‐mobility conjugated polymers are investigated as a function of distance from an interface with polymer gate dielectrics of different dielectric constants. For high‐ k dielectrics, polarons in the accumulation layer at the interface are found to be more localized than those in the bulk.