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Scanning Probe Microscopy: Electrical Scanning Probe Microscopy on Active Organic Electronic Devices (Adv. Mater. 1/2009)
Author(s) -
Pingree Liam S. C.,
Reid Obadiah G.,
Ginger David S.
Publication year - 2009
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.200890111
Subject(s) - materials science , scanning probe microscopy , microscopy , nanotechnology , scanning capacitance microscopy , scanning gate microscopy , optoelectronics , conductive atomic force microscopy , scanning ion conductance microscopy , atomic force microscopy , scanning electron microscope , scanning confocal electron microscopy , optics , composite material , physics
The inside cover, drawn by Irene Wang, illustrates that electrical atomic force microscopy techniques can play an integral part in the research and development of organic electronic materials. On p. 19 Pingree, Reid, and Ginger highlight the use of scanning probe microscopy techniques in examining heterogeneities, defects, and various transport properties including injection, trapping, and generation/recombination in organic lightemitting diodes, thin‐film transistors, and solar cells.