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Probing the Local Conformation within π‐Conjugated One‐dimensional Supramolecular Stacks using Frequency Modulation Atomic Force Microscopy
Author(s) -
Grévin Benjamin,
Demadrille Renaud,
Linares Mathieu,
Lazzaroni Roberto,
Leclère Philippe
Publication year - 2009
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.200803762
Subject(s) - atomic force microscopy , supramolecular chemistry , conjugated system , molecular dynamics , modulation (music) , molecule , microscopy , chemical physics , materials science , molecular mechanics , frequency modulation , molecular physics , nanotechnology , chemistry , computational chemistry , physics , polymer , optics , acoustics , computer science , radio frequency , organic chemistry , composite material , telecommunications
Frequency‐modulation atomic force microscopy is used to investigate the local conformation within 1D stacks obtained by the self‐assembly of π‐conjugated molecules from solution. The structural parameters extracted from the experimental data can be interpreted in terms of local molecular conformation, by comparison with models obtained by molecular mechanics and dynamics simulations.