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Scanning Photoemission Microscopy of Graphene Sheets on SiO 2
Author(s) -
Kim Kijeong,
Lee Hangil,
Choi JaeHyun,
Youn YoungSang,
Choi Junghun,
Lee Hankoo,
Kang TaiHee,
Jung M. C.,
Shin H. J.,
Lee HuJong,
Kim Sehun,
Kim Bongsoo
Publication year - 2008
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.200800742
Subject(s) - graphene , materials science , exfoliation joint , monolayer , graphite , scanning tunneling microscope , micrometer , nanotechnology , microscopy , graphene oxide paper , optics , composite material , physics
Scanning photoemission microscopy (SPEM) images of a graphene flake as well as the C 1s core level spectra for the mono‐ and multilayer graphene are measured. The samples with lateral dimensions on the micrometer scale are prepared on a SiO 2 surface by direct exfoliation of crystalline graphite. Monolayer graphene is distinguished from the multilayer graphens through the chemical contrast images of SPEM.

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