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Random Circuit Breaker Network Model for Unipolar Resistance Switching
Author(s) -
Chae Seung Chul,
Lee Jae Sung,
Kim Sejin,
Lee Shin Buhm,
Chang Seo Hyoung,
Liu Chunli,
Kahng Byungnam,
Shin Hyunjung,
Kim DongWook,
Jung Chang Uk,
Seo Sunae,
Lee MyoungJae,
Noh Tae Won
Publication year - 2008
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.200702024
Subject(s) - circuit breaker , metastability , resistance (ecology) , materials science , electrical engineering , process (computing) , crystallite , computer science , optoelectronics , topology (electrical circuits) , physics , engineering , quantum mechanics , biology , ecology , metallurgy , operating system
The random circuit breaker network model is proposed for unipolar resistance switching behavior. This model describes reversible dynamic processes involving two quasi‐metastable states. The formation and rupture of conducting channels (see figure) in the polycrystalline TiO 2 thin films may be analyzed by the self organized avalanche process in the random circuit breaker network model.