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Controlled Loading of Nanoparticles into Submicrometer Holes
Author(s) -
Mirin N. A.,
Hainey M.,
Halas N. J.
Publication year - 2008
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.200701442
Subject(s) - materials science , nanoparticle , particle (ecology) , nanotechnology , ionic strength , particle size , ionic bonding , chemical physics , chemical engineering , ion , chemistry , oceanography , physics , quantum mechanics , aqueous solution , engineering , geology
Controlled nanoparticle loading into submicron holes is driven by electrostatic interparticle and particle‐hole interactions. The average number of trapped nanoparticles increases with the ionic strength of the suspending medium (left). The relative particle‐hole sizes determine the average number of trapped metal nanoparticles (right).