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High Throughput Surface Characterisation of a Combinatorial Material Library
Author(s) -
Urquhart A. J.,
Anderson D. G.,
Taylor M.,
Alexander M. R.,
Langer R.,
Davies M. C.
Publication year - 2007
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.200700949
Subject(s) - schematic , throughput , x ray photoelectron spectroscopy , materials science , surface (topology) , sample (material) , mass spectrometry , contact angle , polymer , analytical chemistry (journal) , nanotechnology , computer science , information retrieval , chemical engineering , environmental chemistry , chemistry , engineering , electrical engineering , telecommunications , chromatography , composite material , mathematics , geometry , wireless
The figure shows a schematic representing the information that can be obtained from the surface of each polymer sample within the microarrayed library. High throughput surface analytical techniques used include X‐ray photoelectron spectroscopy, time‐of‐flight secondary ion mass spectrometry and water contact angle measurement.