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Imaging the Interfaces of Conjugated Polymer Optoelectronic Devices
Author(s) -
Steuerman D. W.,
Garcia A.,
Dante M.,
Yang R.,
Löfvander J. P.,
Nguyen T.Q.
Publication year - 2008
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.200700887
Subject(s) - materials science , polymer , conjugated system , electrode , optoelectronics , nanotechnology , annealing (glass) , composite material , chemistry
A focused ion beam is used to extract cross‐sectional samples from multilayer conjugated polymer films and optoelectronic devices. Subsequent TEM, AFM and SIMS studies yield insight into polymer‐polymer and polymer‐electrode interfaces and how these interfaces can be controlled by processing conditions, such as choice of solvent and thermal annealing.