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Characterization of Photonic Colloidal Single Crystals by Microradian X‐ray Diffraction
Author(s) -
Thijssen J. H. J.,
Petukhov A. V.,
‘t Hart D. C.,
Imhof A.,
van der Werf C. H. M.,
Schropp R. E. I.,
van Blaaderen A.
Publication year - 2006
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.200502732
Subject(s) - reciprocal lattice , materials science , photonic crystal , colloidal crystal , scattering , diffraction , optics , spheres , photonics , micrometer , colloid , crystallography , optoelectronics , chemical engineering , physics , engineering , chemistry , astronomy
Close‐packed and non‐close‐packed colloidal photonic crystals of silica spheres have been imaged in real space to reveal their 3D structure. Although the lattice spacings are of the order of a micrometer, these crystals can also be characterized in reciprocal space using small‐angle X‐ray scattering (see figure). After infiltration with silicon (see inset), the internal 3D structure of these photonic crystals can only be probed using X‐ray scattering.