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Templated Self‐Assembly of Colloidal Nanoparticles Controlled by Electrostatic Nanopatterning on a Si 3 N 4 /SiO 2 /Si Electret
Author(s) -
Tzeng S.D.,
Lin K.J.,
Hu J.C.,
Chen L.J.,
Gwo S.
Publication year - 2006
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.200501542
Subject(s) - nanoparticle , materials science , electret , nanotechnology , self assembly , monolayer , colloid , electrostatic force microscope , electrostatics , polyelectrolyte , atomic force microscopy , polymer , chemical engineering , chemistry , composite material , engineering
Controlled self‐assembly of colloidal nanoparticles onto an electrically nanopatterned electret film is presented (see figure; EFM: electrostatic force microscopy). An unprecedented reolution of 30 nm is achieved for both charge patterning and nanoparticle assembly. Furthermore, only a close‐packed monolayer of nanoparticles is assembled, allowing better structural control and the possibility of forming hierarchical nanoparticle structures.